Scanning Kelvin probe
Scanning Kelvin probe is a non-contact, non-destructive vibration capacitive device used to test the work function of conductive materials or the surface potential and surface work function of semiconductor materials. The Kelvin probe is a highly sensitive surface analysis technique determined by the top 1-3 layers of atoms or molecules on the material surface. KP Technology currently offers testing systems with the industry's highest resolution of 1-3 meV.

Main features:
● Power function resolution<3meV
Scanning area: 5mm to 300mm (four models, each with a different scanning area)
Scanning resolution: 317.5nm
● Automatic height adjustment
Application areas:
Organic and Non Organic Semiconductors
● Metal
● Thin film
● Solar cells and organic photovoltaic materials
● Corrosion
Upgrade attachments:
Atmospheric Photon Emission System
Surface photovoltage (QTH or LED)
SPS surface photovoltage spectroscopy (400-1000nm)
● Gold or stainless steel probe, diameter 0.05mm to 20mm
● Relative humidity control and nitrogen environmental chamber